-
2026/12/31
Award Nomination Deadline
The inaugural Rasheed M. A. Azzam Medal will be presented at the 1st American Workshop on Ellipsometry (AWE-1) in Lincoln, Nebraska, during the Awards Ceremony scheduled for March 3, 2027.
Purpose
The Rasheed M. A. Azzam Medal is intended to celebrate an individual or a group of individuals for recent, groundbreaking contributions to the field of ellipsometry and related techniques, whether through instrument innovations; through academic, technical, or industrial applications; or through mentorship, education, and outreach.
Nature
The Rasheed M. A. Azzam Medal consists of: a commemorative medallion and/or certificate, stating the title of the Award, the details of the AWE event, and the name of the awardee; plus a monetary prize of $_TBD_.
The inaugural Rasheed M. A. Azzam Medal is sponsored by _TBD_.
Eligibility & Nomination
Nominations and self-nominations are solicited from the broader ellipsometry community. Nominees for the Rasheed M. A. Azzam Medal shall be appropriate to the Purpose of this Award specified above.
Nomination packages must contain the nominees’ concise CV; a comprehensive, ca. 2-page description of contributions to be considered; and a complete list of patents, publications, and/or other relevant achievements. Nomination packages must be submitted to the Chair of the Awards Committee by the deadline specified above.
The AWE-1 Awards Committee will review all nominations and select the winner of the inaugural Rasheed M. A. Azzam Medal.
This Award is dedicated to Rasheed Mohammed Abdel-Gawad Azzam.
Rasheed Mohammed Abdel-Gawad Azzam received his bachelor’s degree in science from Cairo University and his doctorate from the University of Nebraska, where he held postdoctoral and faculty positions. In 1979, he joined the University of New Orleans (UNO) as an electrical engineering professor, where he taught for more than four decades. In 1982, he became a member of UNO’s inaugural class of faculty members who were recognized with the title of Distinguished Professor. He was also a Fulbright Scholar and Visiting Professor at the Université de Provence in France and a Professor of Physics at the American University in Cairo. His research interests included polarized light: its mathematical representations and physical measurement; ellipsometry: its theory, instrumentation, and applications for the characterization of surfaces and thin films; optical polarimetry based on reflective silicon detectors and diffraction gratings; optics of thin films and design of optical devices for polarized light; optics of anisotropic media and liquid crystals; and the theory of reflection. His book “Ellipsometry and Polarized Light” has been cited over 10,000 times and translated into several languages. He served as a topical editor for the Journal of the Optical Society of America (OSA) and Applied Optics, and as a member of the OSA Publications Council. His honors include the 2005 GG Stokes Award of SPIE, International Society for Optical Engineering; the 1993 Photonics Circle of Excellence Award; the 1993 R and D Award; the 1988 Outstanding American Inventor; and Fellow of the Optical Society of America and SPIE.
The North American Ellipsometry Association (NAEA), in collaboration with the American Vacuum Society (AVS) Spectroscopic Ellipsometry (EL) Technical Group, is establishing this Award as the main recognition for the American Workshop on Ellipsometry (AWE) series.
The Ellipsometry Association and AVS · EL Technical Group are seeking financial support to permanently fund this Award for future AWE meetings.
