1st American Workshop on Ellipsometry

February 28 – March 3, 2027, in Lincoln, NE

Scope & Topics

The Technical Program will include a broad range of topics in ellipsometry, polarimetry, and related techniques that utilize polarized light to characterize bulk materials, thin films, surfaces, interfaces, and nanostructures under both static and dynamic conditions.
Topics will cover theory, instrumentation & data analysis, and applications across physics, chemistry, materials science, and life sciences, as well as engineering and metrology.

  • Machine Learning & AI
  • THz & Extreme UV
  • In Situ & Time-Resolved Methods
  • Imaging Ellipsometry
  • Advanced Data Analysis
  • Industrial Applications
  • Metrology
  • Advanced Materials Characterization

Program Summary