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1st American Workshop on Ellipsometry

February 28 – March 3, 2027, in Lincoln, NE

Gold Sponsors

Special-Topic Collection on Ellipsometry

After the 1st American Workshop on Ellipsometry (AWE-1), manuscripts may be submitted to AVS Publications in either Surface Science Spectra (SSS) or Journal of Vacuum Science & Technology B (JVST-B), depending on the topic and content. Manuscripts will undergo regular peer review and will be handled by regular Associate Editors at SSS or JVST-B. Guest editors will assist with the publication process and will provide a dedicated editorial perspective. Accepted manuscripts will be collated in a joint Special-Topic Collection on Ellipsometry.
This Special-Topic Collection on Ellipsometry is now open for submissions and will close on the deadline indicated above.

The Special-Topic Collection on Ellipsometry is devoted to ellipsometry, polarimetry, and related techniques that utilize polarized light to study and understand bulk materials, thin films, surfaces, interfaces, or nanostructures across fundamental and applied research. A wide range of ellipsometry aspects cover recent advances in theory, instrumentation and data analysis, as well as specialized applications across physics, chemistry, materials science, life sciences, engineering, or metrology.

Papers may originate from the AVS 72nd International Symposium (November 8 – 13, 2026, in Pittsburgh, PA) sessions organized by the Spectroscopic Ellipsometry (EL) Technical Group, or from the 1st American Workshop on Ellipsometry (February 28 – March 3, 2027, in Lincoln, NE). Other ellipsometry-related research not originating from these meetings may also be included.

Data records including optical property measurements should be submitted to Surface Science Spectra (SSS). Other regular research articles on research using ellipsometry, polarimetry, and other related techniques should be submitted to the Journal of Vacuum Science & Technology B (JVST-B).

Submit to SSS
Submit to JVST-B

Topics

Topics covered include, but are not limited to:

  • novel hardware and sensing strategies
  • in situ instrumentation and real-time process monitoring
  • THz and EUV wavelengths
  • imaging ellipsometry
  • advanced noise reduction and signal processing
  • machine learning and artificial intelligence for data analysis and modeling
  • dielectric, semiconductor, and metal thin films and nanostructures
  • ferro-/piezoelectrics, ferro-/antiferromagnetics, and multiferroics
  • 2D materials, liquid crystals, and photonic crystals
  • soft materials: organics, polymers, and self-assembled monolayers
  • hybrid, composite, and multicomponent material systems
  • birefringence, optical anisotropy, and chirality
  • next-generation electronic or photonic materials, 3D architectures, and devices
  • metamaterials, metasurfaces, and engineered photonic systems
  • topological, superconducting, and low-dimensional materials for quantum technologies
  • solar, battery, and thermoelectric materials for energy applications

Guest Editors

Eva Schubert (University of Nebraska-Lincoln)
Marcel Junige (University of Colorado Boulder)
Rafał Korlacki (J.A. Woollam Co., Inc.)
Megan Stokey (Milwaukee School of Engineering)
Ufuk Kılıç (University of Nebraska-Lincoln)
Alyssa Mock (Weber State University)

Contribute to the Special-Topic Collection on Ellipsometry

Submit to SSS
Submit to JVST-B
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Schedule & Abstract Book
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Latest Announcements

  • Third Announcement—Call for Award Nominations

    As part of the upcoming 1st American Workshop on Ellipsometry (AWE-1), to be held February 28 – March 3, 2027, in Lincoln, NE, we are pleased to announce this Call for Award Nominations.  The following Awards will recognize and honor excellent achievements at different levels.

    Award Categories

    NAEA Fellow

    For the purpose of providing recognition to deserving Members of the North American Ellipsometry Association (NAEA) who have made sustained and outstanding technical contributions in areas of interest to the Association, one current Member may be elected as a “Fellow of the Association.”  The nominee to be inducted as NAEA Fellow shall have made outstanding contributions in research, engineering, technical or managerial leadership, and/or education for a period of 10 years or more.

    Rasheed M. A. Azzam Medal

    The Rasheed M. A. Azzam Medal is intended to celebrate an individual or a group of individuals for recent, groundbreaking contributions to the field of ellipsometry and related techniques, whether through instrument innovations;  through academic, technical, or industrial applications;  or through mentorship, education, and outreach.

    Student Awards

    Student Awards are intended to recognize undergraduate or graduate students for best oral presentations and for best posters.  Multiple awardees are anticipated.

    Students must identify their undergraduate or graduate student status upon Abstract Submission to participate in the Student Award competitions.  All presenting authors who have indicated student status at the time of abstract submission are automatically considered.

    Nomination Instructions

    Please submit Nominations for the NAEA Fellow and/or for the Rasheed M. A. Azzam Medal to the Awards Committee at awards@ellipsometry.us.  Nominations and self-nominations are permitted.  Please click the respective link above to find more information about each Award, including the required materials for Award Nominations.

    Please submit Award Nominations no later than December 31, 2026!

    Award winners will be informed by February 14, 2027.  Student Award winners will be determined based on evaluations during the workshop.

    Thank you for helping us celebrate excellence in ellipsometry.  We look forward to your Nominations!

    Best regards,
    AWE-1 Awards Committee

  • Second Announcement—Call for Abstracts

    The 1st American Workshop on Ellipsometry (AWE-1) will be held February 28 – March 3, 2027, at the Conference Center on the Nebraska Innovation Campus in Lincoln, Nebraska.

    The workshop Committees invite students, early-career professionals, and experienced leaders across academic, public, and industrial sectors to contribute an abstract. International participants are welcome and expressly encouraged to attend.

    AWE-1 is especially dedicated to the participation of undergraduate and graduate students.  Accordingly, we aim to keep students’ attendance and lodging costs as affordable as possible—thanks to the generous support of our Sponsors. Workshop Registration will be $200 for Students and $400 for Regular attendees.

    The Technical Program will include a broad range of topics in ellipsometry, polarimetry, and related techniques that utilize polarized light to characterize bulk materials, thin films, surfaces, interfaces, and nanostructures under both static and dynamic conditions. Topics will cover theory, instrumentation & data analysis, and applications across physics, chemistry, materials science, and life sciences, as well as engineering and metrology.

    Please prepare abstracts according to the Author Instructions
    and submit via the Abstract Submission System
    before October 31, 226!

    Abstracts should cover work that has been published recently or is yet unpublished. Abstracts must contain sufficient information to allow for peer review by the Program Committee. Abstracts will be evaluated upon receipt. Acceptance notifications will be sent at the beginning of November 2026. Please submit early!

    In the abstract, please identify the corresponding and presenting authors. For student presenters who wish to participate in the Student Award competition, please identify the student status in the abstract. If the presenting author cannot attend the workshop, please arrange for another co-author to attend and present, and inform the workshop organizers as soon as possible.

    Contributed presentations will be included in a digital Abstract Booklet and scheduled into Oral or Poster Sessions with dates and times assigned as the Program Schedule is finalized. The Abstract Booklet & Program Schedule will be published on the workshop website. Oral Sessions are currently anticipated as single-track.

    The Technical Program includes complimentary Tutorials; Oral and Poster Sessions with a Keynote, 101 Lectures, and Invited Talks; and Social Events—providing ample opportunities for scientific and technical discussions and professional networking.  An Awards Ceremony will celebrate an inaugural NAEA Fellow, recipient of the Rasheed M. A. Azzam Medal, and multiple Student Awardees. A simultaneous Industry Exhibition will showcase the latest equipment developments.

    We look forward to seeing you in Lincoln, NE, in early 2027!
    Please direct any questions or inquiries to awe1@ellipsometry.us