From Monday through Wednesday, March 1–3, 2027, Oral and Poster Sessions will take place in the Conference Center on the Nebraska Innovation Campus, including an outstanding Keynote and a lineup of excellent Invited Speakers. The Keynote is intended to provide a high-level overview, summarizing developments in ellipsometry and related techniques over the past ~5 years, and looking ahead at a broad range of applications that will drive future advances. Invited Talks are intended to introduce advanced concepts in instrumentation and data analysis, as well as specialized applications, that are highly topical or emerging.
Please find the up-to-date Schedule of Events in the Abstract Book.
Keynote
TBD
Keynote Title _TBD_
Keynote Speaker Bio _tbd_

Invited Speakers
Hiroyuki Fujiwara
National Institute of Advanced Industrial Science and Technology, Japan
Advances in Deep Learning-Based Spectroscopic Ellipsometry
Argonne National Laboratory
In Situ Combination of Spectroscopic Ellipsometry and Calorimetry
Brigham Young University
Multi-Instrument Characterization of Thin Films: How and Why Ellipsometry Matters.
Connie B. Roth
Emory University
Ellipsometry in Polymer Physics
Onto Innovation
Optical Critical Dimension Metrology with Spectroscopic Ellipsometry: The Workhorse of Process Control in Advanced Nodes
TBD
TBD
Title _tbd_
Refreshments will be served during Oral Session breaks and during Poster Sessions. Lunch will be served on Monday and Tuesday.





